- PII
- 10.31857/S0044457X24020025-1
- DOI
- 10.31857/S0044457X24020025
- Publication type
- Article
- Status
- Published
- Authors
- Volume/ Edition
- Volume 69 / Issue number 2
- Pages
- 155-165
- Abstract
- Using the method of pyrolysis of solutions in a melt, the phase formation of sodium and zirconium silicophosphates Na1+xZr2SixP3–xO12 was studied depending on the concentrations of sodium and phosphorus in the precursors. The influence of the content of these components, as well as firing conditions on the change in the ionic conductivity of NASICON was studied. Methods of X-ray phase analysis, scanning electron microscopy, full-profile Rietveld analysis, and electrochemical impedance spectroscopy were used. The specific values of grain conductivity (σb) and grain boundaries (σgb) of the samples were calculated. It was found that the reason for the change in ionic conductivity is a change in the composition of NASICON with increasing concentrations of sodium and phosphorus in the precursor. The main condition for high conductivity of the material is the formation of a crystalline phase corresponding to the composition Na3Zr2Si2РO12, as well as a minimum amount of impurities and glass phase. The conductivity of the NASICON sample (x = 2) under certain processing conditions is ~ 1 · 10-3 S/cm.
- Keywords
- NASICON ионные проводники пиролиз растворов в расплаве фазовый состав
- Date of publication
- 15.02.2024
- Year of publication
- 2024
- Number of purchasers
- 0
- Views
- 42
References
- 1. Goodenough J.B., Hong H.Y-P., Kafalas J.A. // Mater. Res. Bull. 1976. V. 11. № 2. P. 203. https://doi.org/10.1016/0025-5408 (76)90077-5
- 2. Hong H.Y-P. // Mater. Res. Bull. 1976. V. 11. № 2. P. 173. https://doi.org/10.1016/0025-5408 (76)90073-8
- 3. Li C., Li R., Liu K. et al. // Interdiscip. Mater. 2022. P. 1. https://doi.org/10.1002/idm2.12044
- 4. Guin M., Tietz F. // J. Power Sources. 2015. V. 273. P. 1056. https://doi.org/10.1016/j.jpowsour.2014.09.137
- 5. Lalere F., Leriche J.B., Courty M. et al. // J. Power Sources. 2014. V. 247. P. 975. https://doi.org/10.1016/j.jpowsour.2013.09.051
- 6. Fergus J.-W. // Solid State Ionics. 2012. V. 227. P. 102. https://doi.org/10.1016/j.ssi.2012.09.019
- 7. Narayanan S., Reid S., Butler S., Thangadurai V. // Solid State Ionics. 2019. V. 331. P. 22. https://doi.org/10.1016/j.ssi.2018.12.003
- 8. Rao Y.B., Bharathi K.К., Patro L.N. // Solid State Ionics. 2021. V. 366–377. P. 115671. https://doi.org/10.1016/j.ssi.2021.115671
- 9. Wang H., Zhao G., Wang S. et al. // Nanoscale. 2022. V. 14. № 3. P. 823. https://doi.org/10.1039/d1nr06959d
- 10. Naqash S., Tietz F., Yazhenskikh E. et al. // Solid State Ionics. 2019. V. 336. P. 57. https://doi.org/10.1016/j.ssi.2019.03.017
- 11. Грищенко Д.Н., Курявый В.Г., Подгорбунский А.Б., Медков М.А. // Журн. неорган. химии. 2023. Т. 68. № 1. С. 17. https://doi.org/10.31857/S0044457X22601043
- 12. Fuentes R.O., Marques F.M.B., Franco J.I. // Bol. Soc. Esp. Cerám. Vidrio. 1999. V. 38. № 6. P. 631.
- 13. Zhang S., Quan B., Zhiyong Z., Zhao B. // Materials Letters. 2004. V. 58. № 1. P. 226.
- 14. Yang G., Zhai Y., Yao J. et al. // Chem. Commun. 2021. V. 57. P. 4023. https://doi.org/10.1039/d0cc07261c
- 15. Brug G.J., van den Eeden A.L.G., Sluyters-Rehbach M., Sluyters J.H. // J. Electroanal. Chem. Interfacial Electrochem. 1984. V. 176. P. 275. https://doi.org/10.1016/S0022-0728 (84)80324-1
- 16. Bauerle J.E. // J. Phys. Chem. Solids. 1969. V. 30. P. 2657. https://doi.org/10.1016/0022-3697 (69)90039-0
- 17. Bauerle J.E., Hrizo J. // J. Phys. Chem. Solids. 1969. V. 30. P. 565. https://doi.org/10.1016/0022-3697 (69)90011-0
- 18. Kim S.K., Mao A., Sen S., Kim S. // Chem. Mater. 2014. V. 26. P. 5695. https://doi.org/10.1021/cm502542p
- 19. Suzuki K., Noi K., Hayashi A., Tatsumisago M. // Scr. Mater. 2018. V. 145. P. 67. https://doi.org/10.1016/j.scriptamat.2017.10.010
- 20. Ren K., Cao Y., Chen Y. et al. // Scripta Mater. 2020. V. 187. P. 384. https://doi.org/10.1016/j.scriptamat.2020.06.055
- 21. Ngo Q.Q., Nguyen V.N., To V.N. et al. // Интеллектуальная электротехника. 2022. № 2. C. 16. https://doi.org/10.46960/2658-6754_2022_2_16
